# Mines Saint-Étienne

**Type:** Institutions  
**Canonical URL:** https://scholariq.org/institutions/mines-saint-etienne/

## Facts

| Field | Value |
| --- | --- |
| Avg h-index | 35.5 |
| Citations | 393,713 |
| City | Saint-Etienne |
| Country | FR |
| Description | Mines Saint-Étienne is a research organisation in Saint-Etienne, FR. OpenAlex records 10,817 works and 393,713 citations for it. 1,593 researchers list it as their most recent affiliation. |
| Homepage | https://www.mines-stetienne.fr |
| OpenAlex ID | https://openalex.org/I3019848993 |
| Region | Auvergne-Rhône-Alpes |
| Researchers | 1,593 |
| ROR ID | https://ror.org/05a1dws80 |
| Type | education |
| Works | 10,817 |

## University papers

- [Production and processing of graphene and related materials](https://scholariq.org/papers/production-and-processing-of-graphene-and-related-materials/)
- [An interpretable unsupervised Bayesian network model for fault detection and diagnosis](https://scholariq.org/papers/an-interpretable-unsupervised-bayesian-network-model-for-fault-detection-and/)
- [NbN multilayer technology on R-plane sapphire](https://scholariq.org/papers/nbn-multilayer-technology-on-r-plane-sapphire/)
- [A Structure Data-Driven Framework for Virtual Metrology Modeling](https://scholariq.org/papers/a-structure-data-driven-framework-for-virtual-metrology-modeling/)
- [Virtual Metrology Modeling for CVD Film Thickness](https://scholariq.org/papers/virtual-metrology-modeling-for-cvd-film-thickness/)
- [Virtual Metrology models for predicting physical measurement in semiconductor manufacturing](https://scholariq.org/papers/virtual-metrology-models-for-predicting-physical-measurement-in-semiconductor/)
- [A physics-informed Run-to-Run control framework for semiconductor manufacturing](https://scholariq.org/papers/a-physics-informed-run-to-run-control-framework-for-semiconductor-manufacturing/)
- [Tool Condition Diagnosis With a Recipe-Independent Hierarchical Monitoring Scheme](https://scholariq.org/papers/tool-condition-diagnosis-with-a-recipe-independent-hierarchical-monitoring/)
- [Virtual metrology for semiconductor manufacturing: Focus on transfer learning](https://scholariq.org/papers/virtual-metrology-for-semiconductor-manufacturing-focus-on-transfer-learning/)
- [Virtual metrology models for predicting avera PECVD oxide film thickne](https://scholariq.org/papers/virtual-metrology-models-for-predicting-avera-pecvd-oxide-film-thickne/)
- [On-chip high-frequency diagnostic of RSFQ logic cells](https://scholariq.org/papers/on-chip-high-frequency-diagnostic-of-rsfq-logic-cells/)

## University researchers

- [Agnès Roussy](https://scholariq.org/researchers/agnes-roussy/)

## University top topics

Showing 8 of 25.

- [Scheduling and Optimization Algorithms](https://scholariq.org/topics/scheduling-and-optimization-algorithms/)
- [Microstructure and mechanical properties](https://scholariq.org/topics/microstructure-and-mechanical-properties/)
- [Metallurgy and Material Forming](https://scholariq.org/topics/metallurgy-and-material-forming/)
- [Advanced ceramic materials synthesis](https://scholariq.org/topics/advanced-ceramic-materials-synthesis/)
- [Advanced Manufacturing and Logistics Optimization](https://scholariq.org/topics/advanced-manufacturing-and-logistics-optimization/)
- [Manufacturing Process and Optimization](https://scholariq.org/topics/manufacturing-process-and-optimization/)
- [Microstructure and Mechanical Properties of Steels](https://scholariq.org/topics/microstructure-and-mechanical-properties-of-steels/)
- [Assembly Line Balancing Optimization](https://scholariq.org/topics/assembly-line-balancing-optimization/)

---
Source: ScholarIQ — public research metadata, principally OpenAlex. See https://scholariq.org/sources/ for provenance and https://scholariq.org/methodology/ for what these figures mean.