# Microelectronics Reliability

**Type:** Journals  
**Canonical URL:** https://scholariq.org/journals/microelectronics-reliability/

## Facts

| Field | Value |
| --- | --- |
| APC (USD) | 2,190 |
| Citations | 203,210 |
| h-index | 132 |
| Homepage | https://www.journals.elsevier.com/microelectronics-reliability |
| Open Access | false |
| ISSN-L | 0026-2714 |
| ISSNs | 0026-2714,1872-941X |
| OpenAlex ID | https://openalex.org/S133646729 |
| Publisher | Elsevier BV |
| Works | 31,060 |

## Journal papers

- [Remaining useful life prediction of aviation circular electrical connectors using vibration-induced physical model and particle filtering method](https://scholariq.org/papers/remaining-useful-life-prediction-of-aviation-circular-electrical-connectors/)
- [Two phase cooling with nano-fluid for highly dense electronic systems-on-chip – A pilot study](https://scholariq.org/papers/two-phase-cooling-with-nano-fluid-for-highly-dense-electronic-systems-on-chip-a/)
- [Stress factors in aircraft electronics: Superimpositions, case studies and failure precautions](https://scholariq.org/papers/stress-factors-in-aircraft-electronics-superimpositions-case-studies-and-failure/)

## Journal top topics

Showing 8 of 22.

- [Semiconductor materials and devices](https://scholariq.org/topics/semiconductor-materials-and-devices/)
- [Integrated Circuits and Semiconductor Failure Analysis](https://scholariq.org/topics/integrated-circuits-and-semiconductor-failure-analysis/)
- [Advancements in Semiconductor Devices and Circuit Design](https://scholariq.org/topics/advancements-in-semiconductor-devices-and-circuit-design/)
- [Electronic Packaging and Soldering Technologies](https://scholariq.org/topics/electronic-packaging-and-soldering-technologies/)
- [Reliability and Maintenance Optimization](https://scholariq.org/topics/reliability-and-maintenance-optimization/)
- [Silicon Carbide Semiconductor Technologies](https://scholariq.org/topics/silicon-carbide-semiconductor-technologies/)
- [VLSI and Analog Circuit Testing](https://scholariq.org/topics/vlsi-and-analog-circuit-testing/)
- [Software Reliability and Analysis Research](https://scholariq.org/topics/software-reliability-and-analysis-research/)

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Source: ScholarIQ — public research metadata, principally OpenAlex. See https://scholariq.org/sources/ for provenance and https://scholariq.org/methodology/ for what these figures mean.