# SIAM International Conference on Data Mining

**Type:** Journals  
**Canonical URL:** https://scholariq.org/journals/siam-international-conference-on-data-mining/

## Facts

| Field | Value |
| --- | --- |
| Citations | 305 |
| h-index | 8 |
| Open Access | false |
| OpenAlex ID | https://openalex.org/S4306420871 |
| Works | 3,218 |

## Journal papers

- [DMA SRAM TEGにより解析したSRAMのスタティックノイズマージンにおけるDIBLばらつきの影響(IEDM特集(先端CMOSデバイス・プロセス技術))](https://scholariq.org/papers/dma-sram-teg-sram-dibl-iedm-cmos/)
- [3次元プロセスデバイスシミュレーションによるBulk-FinFETの駆動電流の改善(プロセス・デバイス・回路シミュレーション及び一般)](https://scholariq.org/papers/3-bulk-finfet/)
- [ナノスケールMOSFETにおけるプラズマドーピングとレーザーアニールを適用した急峻SDEの検討(低電圧/低消費電力技術,新デバイス・回路とその応用)](https://scholariq.org/papers/mosfet-sde/)
- [hp32nmノード以降に向けた周辺回路がBulk Planar FET及びメモリセルがBulk-FinFETで構成されたSRAM技術について(VLSI回路,デバイス技術(高速,低電圧,低消費電力))](https://scholariq.org/papers/hp32nm-bulk-planar-fet-bulk-finfet-sram-vlsi/)
- [微細MOSトランジスタにおけるDIBLおよび電流立上り電圧ばらつきの統計解析(低電圧/低消費電力技術,新デバイス・回路とその応用)](https://scholariq.org/papers/mos-dibl/)
- [hp22 nm Node Low Operating Power(LOP)向けSub-10nmゲートCMOS技術(VLSI回路,デバイス技術(高速,低電圧,低電力))](https://scholariq.org/papers/hp22-nm-node-low-operating-power-lop-sub-10nm-cmos-vlsi/)
- [Takeuchiプロットを用いたHigh-k/Metal-Gate MOSFETのばらつき評価(低電圧/低消費電力技術,新デバイス・回路とその応用)](https://scholariq.org/papers/takeuchi-high-k-metal-gate-mosfet/)
- [極薄膜NO Oxynitrideゲート絶縁膜とNi SALICIDEプロセスを用いた高性能35nmゲート長CMOS](https://scholariq.org/papers/no-oxynitride-ni-salicide-35nm-cmos/)

## Journal top topics

Showing 8 of 23.

- [Legal and Regulatory Analysis](https://scholariq.org/topics/legal-and-regulatory-analysis/)
- [Linguistic, Cultural, and Literary Studies](https://scholariq.org/topics/linguistic-cultural-and-literary-studies/)
- [Military Technology and Strategies](https://scholariq.org/topics/military-technology-and-strategies/)
- [Semiconductor materials and devices](https://scholariq.org/topics/semiconductor-materials-and-devices/)
- [Advancements in Semiconductor Devices and Circuit Design](https://scholariq.org/topics/advancements-in-semiconductor-devices-and-circuit-design/)
- [Semiconductor materials and interfaces](https://scholariq.org/topics/semiconductor-materials-and-interfaces/)
- [Radio Frequency Integrated Circuit Design](https://scholariq.org/topics/radio-frequency-integrated-circuit-design/)
- [Integrated Circuits and Semiconductor Failure Analysis](https://scholariq.org/topics/integrated-circuits-and-semiconductor-failure-analysis/)

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Source: ScholarIQ — public research metadata, principally OpenAlex. See https://scholariq.org/sources/ for provenance and https://scholariq.org/methodology/ for what these figures mean.