# A simple and accurate method to measure the threshold voltage of an enhancement-mode MOSFET

**Type:** Papers  
**Canonical URL:** https://scholariq.org/papers/a-simple-and-accurate-method-to-measure-the-threshold-voltage-of-an-enhancement/

## Facts

| Field | Value |
| --- | --- |
| Author Names | Hee‐Gook Lee,Soo‐Young Oh,George C. Fuller |
| Citations | 104 |
| DOI | 10.1109/t-ed.1982.20707 |
| Fields | Engineering,Physics and Astronomy |
| Open Access | false |
| OA Status | closed |
| OpenAlex ID | https://openalex.org/W2044254078 |
| Type | article |
| Year | 1982 |

## Paper authors

- [Soo‐Young Oh](https://scholariq.org/researchers/soo-young-oh/)

## Paper primary topic

- [Advancements in Semiconductor Devices and Circuit Design](https://scholariq.org/topics/advancements-in-semiconductor-devices-and-circuit-design/)

## Paper topics

- [Semiconductor materials and devices](https://scholariq.org/topics/semiconductor-materials-and-devices/)
- [Advancements in Semiconductor Devices and Circuit Design](https://scholariq.org/topics/advancements-in-semiconductor-devices-and-circuit-design/)
- [Quantum and electron transport phenomena](https://scholariq.org/topics/quantum-and-electron-transport-phenomena/)

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Source: ScholarIQ — public research metadata, principally OpenAlex. See https://scholariq.org/sources/ for provenance and https://scholariq.org/methodology/ for what these figures mean.