# Advances in Large-Scale Metrology – Review and future trends

**Type:** Papers  
**Canonical URL:** https://scholariq.org/papers/advances-in-large-scale-metrology-review-and-future-trends/

## Facts

| Field | Value |
| --- | --- |
| Author Names | Robert Schmitt,Martin Peterek,Edward Morse,Wolfgang Knapp,Maurizio Galetto,Frank Härtig,G. Goch,Ben Hughes,Andrew Forbes,William T. Estler |
| Citations | 257 |
| DOI | 10.1016/j.cirp.2016.05.002 |
| Fields | Engineering |
| Open Access | false |
| OA Status | closed |
| OpenAlex ID | https://openalex.org/W2465146196 |
| Type | article |
| Year | 2016 |

## Paper authors

- [Robert Schmitt](https://scholariq.org/researchers/robert-schmitt/)

## Paper primary topic

- [Advanced Measurement and Metrology Techniques](https://scholariq.org/topics/advanced-measurement-and-metrology-techniques/)

## Paper topics

- [Advanced Measurement and Metrology Techniques](https://scholariq.org/topics/advanced-measurement-and-metrology-techniques/)
- [Surface Roughness and Optical Measurements](https://scholariq.org/topics/surface-roughness-and-optical-measurements/)
- [Advanced Surface Polishing Techniques](https://scholariq.org/topics/advanced-surface-polishing-techniques/)

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Source: ScholarIQ — public research metadata, principally OpenAlex. See https://scholariq.org/sources/ for provenance and https://scholariq.org/methodology/ for what these figures mean.