# Behaviors of InGaZnO thin film transistor under illuminated positive gate-bias stress

**Type:** Papers  
**Canonical URL:** https://scholariq.org/papers/behaviors-of-ingazno-thin-film-transistor-under-illuminated-positive-gate-bias/

## Facts

| Field | Value |
| --- | --- |
| Author Names | Te-Chih Chen,Ting‐Chang Chang,Chih-Tsung Tsai,Tien‐Yu Hsieh,Shih-Ching Chen,Chia-Sheng Lin,Ming‐Chin Hung,Chun‐Hao Tu,Jiun‐Jye Chang,Po-Lun Chen |
| Citations | 184 |
| DOI | 10.1063/1.3481676 |
| Fields | Engineering,Materials Science |
| Open Access | false |
| OA Status | closed |
| OpenAlex ID | https://openalex.org/W1979359101 |
| Type | article |
| Year | 2010 |

## Paper authors

- [Shih-Ching Chen](https://scholariq.org/researchers/shih-ching-chen/)

## Paper primary topic

- [Thin-Film Transistor Technologies](https://scholariq.org/topics/thin-film-transistor-technologies/)

## Paper topics

- [Thin-Film Transistor Technologies](https://scholariq.org/topics/thin-film-transistor-technologies/)
- [ZnO doping and properties](https://scholariq.org/topics/zno-doping-and-properties/)
- [Semiconductor materials and devices](https://scholariq.org/topics/semiconductor-materials-and-devices/)

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Source: ScholarIQ — public research metadata, principally OpenAlex. See https://scholariq.org/sources/ for provenance and https://scholariq.org/methodology/ for what these figures mean.