# Bias-induced oxygen adsorption in zinc tin oxide thin film transistors under dynamic stress

**Type:** Papers  
**Canonical URL:** https://scholariq.org/papers/bias-induced-oxygen-adsorption-in-zinc-tin-oxide-thin-film-transistors-under/

## Facts

| Field | Value |
| --- | --- |
| Author Names | Yi‐Chun Chen,Ting‐Chang Chang,Hung-Wei Li,Shih-Ching Chen,Jin Lu,Wan-Fang Chung,Ya‐Hsiang Tai,Tseung‐Yuen Tseng |
| Citations | 126 |
| DOI | 10.1063/1.3457996 |
| Fields | Engineering,Materials Science |
| Open Access | false |
| OA Status | closed |
| OpenAlex ID | https://openalex.org/W1973785269 |
| Type | article |
| Year | 2010 |

## Paper authors

- [Shih-Ching Chen](https://scholariq.org/researchers/shih-ching-chen/)

## Paper primary topic

- [Thin-Film Transistor Technologies](https://scholariq.org/topics/thin-film-transistor-technologies/)

## Paper topics

- [Thin-Film Transistor Technologies](https://scholariq.org/topics/thin-film-transistor-technologies/)
- [ZnO doping and properties](https://scholariq.org/topics/zno-doping-and-properties/)
- [Transition Metal Oxide Nanomaterials](https://scholariq.org/topics/transition-metal-oxide-nanomaterials/)

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Source: ScholarIQ — public research metadata, principally OpenAlex. See https://scholariq.org/sources/ for provenance and https://scholariq.org/methodology/ for what these figures mean.