# Deep Learning for Automated Defect Detection in Industrial Manufacturing

**Type:** Papers  
**Canonical URL:** https://scholariq.org/papers/deep-learning-for-automated-defect-detection-in-industrial-manufacturing/

## Facts

| Field | Value |
| --- | --- |
| Author Names | Milan Parikh,Srinivas Ramavath,S. Prathi,K. Selva Sheela,Ramachandra Handaragal,R. Nathiya |
| Citations | 2 |
| DOI | 10.1109/icesc65114.2025.11212369 |
| Fields | Computer Science,Engineering |
| Open Access | false |
| OA Status | closed |
| OpenAlex ID | https://openalex.org/W4415708537 |
| Type | conference-paper |
| Year | 2025 |

## Paper authors

- [K. Selva Sheela](https://scholariq.org/researchers/k-selva-sheela/)

## Paper primary topic

- [Industrial Vision Systems and Defect Detection](https://scholariq.org/topics/industrial-vision-systems-and-defect-detection/)

## Paper topics

- [Industrial Vision Systems and Defect Detection](https://scholariq.org/topics/industrial-vision-systems-and-defect-detection/)
- [Advanced Neural Network Applications](https://scholariq.org/topics/advanced-neural-network-applications/)
- [Infrastructure Maintenance and Monitoring](https://scholariq.org/topics/infrastructure-maintenance-and-monitoring/)

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Source: ScholarIQ — public research metadata, principally OpenAlex. See https://scholariq.org/sources/ for provenance and https://scholariq.org/methodology/ for what these figures mean.