# Ensemble Bayesian Network for root cause analysis of product defects via learning from historical production data

**Type:** Papers  
**Canonical URL:** https://scholariq.org/papers/ensemble-bayesian-network-for-root-cause-analysis-of-product-defects-via/

## Facts

| Field | Value |
| --- | --- |
| Author Names | Karen Wang,Chao Liu,Yuqian Lu |
| Citations | 22 |
| DOI | 10.1016/j.jmsy.2024.06.001 |
| Fields | Decision Sciences,Engineering |
| Open Access | true |
| OA Status | hybrid |
| OA URL | https://doi.org/10.1016/j.jmsy.2024.06.001 |
| OpenAlex ID | https://openalex.org/W4399661208 |
| Type | article |
| Year | 2024 |

## Paper authors

- [Karen Wang](https://scholariq.org/researchers/karen-wang/)
- [Chao Liu](https://scholariq.org/researchers/chao-liu/)
- [Yuqian Lu](https://scholariq.org/researchers/yuqian-lu/)

## Paper journal

- [Journal of Manufacturing Systems](https://scholariq.org/journals/journal-of-manufacturing-systems/)

## Paper primary topic

- [Fault Detection and Control Systems](https://scholariq.org/topics/fault-detection-and-control-systems/)

## Paper topics

- [Fault Detection and Control Systems](https://scholariq.org/topics/fault-detection-and-control-systems/)
- [Industrial Vision Systems and Defect Detection](https://scholariq.org/topics/industrial-vision-systems-and-defect-detection/)
- [Advanced Statistical Process Monitoring](https://scholariq.org/topics/advanced-statistical-process-monitoring/)

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Source: ScholarIQ — public research metadata, principally OpenAlex. See https://scholariq.org/sources/ for provenance and https://scholariq.org/methodology/ for what these figures mean.