# Fault Cause Identification across Manufacturing Lines through Ontology-Guided and Process-Aware FMEA Graph Learning with LLMs

**Type:** Papers  
**Canonical URL:** https://scholariq.org/papers/fault-cause-identification-across-manufacturing-lines-through-ontology-guided/

## Facts

| Field | Value |
| --- | --- |
| Author Names | Sho Okazaki,Kohei Kaminishi,Takuma Fujiu,Yusheng Wang,Manu Sasidharan,Jun Ota |
| Citations | 0 |
| DOI | 10.48550/arxiv.2510.15428 |
| Fields | Computer Science,Engineering |
| Open Access | true |
| OA Status | green |
| OA URL | https://arxiv.org/pdf/2510.15428 |
| OpenAlex ID | https://openalex.org/W4415879987 |
| Type | preprint |
| Year | 2025 |

## Paper authors

- [Sho Okazaki](https://scholariq.org/researchers/sho-okazaki/)

## Paper journal

- [arXiv (Cornell University)](https://scholariq.org/journals/arxiv-cornell-university/)

## Paper primary topic

- [Machine Fault Diagnosis Techniques](https://scholariq.org/topics/machine-fault-diagnosis-techniques/)

## Paper topics

- [Machine Fault Diagnosis Techniques](https://scholariq.org/topics/machine-fault-diagnosis-techniques/)
- [Digital Transformation in Industry](https://scholariq.org/topics/digital-transformation-in-industry/)
- [Anomaly Detection Techniques and Applications](https://scholariq.org/topics/anomaly-detection-techniques-and-applications/)

---
Source: ScholarIQ — public research metadata, principally OpenAlex. See https://scholariq.org/sources/ for provenance and https://scholariq.org/methodology/ for what these figures mean.