# High-exposure-durability, high-quantum-efficiency (>90%) backside-illuminated soft-X-ray CMOS sensor

**Type:** Papers  
**Canonical URL:** https://scholariq.org/papers/high-exposure-durability-high-quantum-efficiency-and-gt-90-backside-illuminated/

## Facts

| Field | Value |
| --- | --- |
| Author Names | Tetsuo Harada,Nobukazu Teranishi,Takeo Watanabe,Quan Zhou,Jan Bogaerts,Xinyang Wang |
| Citations | 41 |
| DOI | 10.7567/1882-0786/ab5b5e |
| Fields | Engineering,Medicine,Physics and Astronomy |
| Open Access | true |
| OA Status | hybrid |
| OA URL | https://doi.org/10.7567/1882-0786/ab5b5e |
| OpenAlex ID | https://openalex.org/W2990074955 |
| Type | article |
| Year | 2019 |

## Paper authors

- [Quan Zhou](https://scholariq.org/researchers/quan-zhou-2/)

## Paper primary topic

- [Integrated Circuits and Semiconductor Failure Analysis](https://scholariq.org/topics/integrated-circuits-and-semiconductor-failure-analysis/)

## Paper topics

- [Integrated Circuits and Semiconductor Failure Analysis](https://scholariq.org/topics/integrated-circuits-and-semiconductor-failure-analysis/)
- [Medical Imaging Techniques and Applications](https://scholariq.org/topics/medical-imaging-techniques-and-applications/)
- [Advanced X-ray Imaging Techniques](https://scholariq.org/topics/advanced-x-ray-imaging-techniques/)

---
Source: ScholarIQ — public research metadata, principally OpenAlex. See https://scholariq.org/sources/ for provenance and https://scholariq.org/methodology/ for what these figures mean.