# Hybrid Feature Selection for Wafer Acceptance Test Parameters in Semiconductor Manufacturing

**Type:** Papers  
**Canonical URL:** https://scholariq.org/papers/hybrid-feature-selection-for-wafer-acceptance-test-parameters-in-semiconductor/

## Facts

| Field | Value |
| --- | --- |
| Author Names | Hongwei Xu,Jie Zhang,Youlong Lv,Peng Zheng |
| Citations | 40 |
| DOI | 10.1109/access.2020.2966520 |
| Fields | Engineering |
| Open Access | true |
| OA Status | gold |
| OA URL | https://ieeexplore.ieee.org/ielx7/6287639/8948470/08959151.pdf |
| OpenAlex ID | https://openalex.org/W2999735491 |
| Type | article |
| Year | 2020 |

## Paper authors

- [Hongwei Xu](https://scholariq.org/researchers/hongwei-xu/)

## Paper journal

- [IEEE Access](https://scholariq.org/journals/ieee-access/)

## Paper primary topic

- [Industrial Vision Systems and Defect Detection](https://scholariq.org/topics/industrial-vision-systems-and-defect-detection/)

## Paper topics

- [Industrial Vision Systems and Defect Detection](https://scholariq.org/topics/industrial-vision-systems-and-defect-detection/)
- [Non-Destructive Testing Techniques](https://scholariq.org/topics/non-destructive-testing-techniques/)
- [Image Processing Techniques and Applications](https://scholariq.org/topics/image-processing-techniques-and-applications/)

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Source: ScholarIQ — public research metadata, principally OpenAlex. See https://scholariq.org/sources/ for provenance and https://scholariq.org/methodology/ for what these figures mean.