# Infrared Characterization of Interfacial Si−O Bond Formation on Silanized Flat SiO<sub>2</sub>/Si Surfaces

**Type:** Papers  
**Canonical URL:** https://scholariq.org/papers/infrared-characterization-of-interfacial-si-o-bond-formation-on-silanized-flat/

## Facts

| Field | Value |
| --- | --- |
| Author Names | Ruhai Tian,Oliver Seitz,Meng Li,Walter Hu,Yves J. Chabal,Jin‐Ming Gao |
| Citations | 181 |
| DOI | 10.1021/la904597c |
| Fields | Engineering,Physics and Astronomy |
| Open Access | false |
| OA Status | closed |
| OpenAlex ID | https://openalex.org/W2020786878 |
| PMID | 20180563 |
| Type | article |
| Year | 2010 |

## Paper authors

- [Walter Hu](https://scholariq.org/researchers/walter-hu/)

## Paper primary topic

- [Molecular Junctions and Nanostructures](https://scholariq.org/topics/molecular-junctions-and-nanostructures/)

## Paper topics

- [Semiconductor materials and devices](https://scholariq.org/topics/semiconductor-materials-and-devices/)
- [Molecular Junctions and Nanostructures](https://scholariq.org/topics/molecular-junctions-and-nanostructures/)
- [Semiconductor materials and interfaces](https://scholariq.org/topics/semiconductor-materials-and-interfaces/)

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Source: ScholarIQ — public research metadata, principally OpenAlex. See https://scholariq.org/sources/ for provenance and https://scholariq.org/methodology/ for what these figures mean.