# Novel High Holding Voltage SCR with Embedded Carrier Recombination Structure for Latch-up Immune and Robust ESD Protection

**Type:** Papers  
**Canonical URL:** https://scholariq.org/papers/novel-high-holding-voltage-scr-with-embedded-carrier-recombination-structure-for/

## Facts

| Field | Value |
| --- | --- |
| Author Names | Zhuo Wang,Zhao Qi,Longfei Liang,Ming Qiao,Zhaoji Li,Bo Zhang |
| Citations | 10 |
| DOI | 10.1186/s11671-019-3017-8 |
| Fields | Engineering |
| Open Access | true |
| OA Status | gold |
| OA URL | https://nanoscalereslett.springeropen.com/track/pdf/10.1186/s11671-019-3017-8 |
| OpenAlex ID | https://openalex.org/W2946945735 |
| PMID | 31139957 |
| Type | article |
| Year | 2019 |

## Paper authors

- [Longfei Liang](https://scholariq.org/researchers/longfei-liang/)

## Paper primary topic

- [Engineering](https://scholariq.org/topics/engineering/)

## Paper topics

- [Electromagnetic Compatibility and Noise Suppression](https://scholariq.org/topics/electromagnetic-compatibility-and-noise-suppression/)
- [Integrated Circuits and Semiconductor Failure Analysis](https://scholariq.org/topics/integrated-circuits-and-semiconductor-failure-analysis/)

---
Source: ScholarIQ — public research metadata, principally OpenAlex. See https://scholariq.org/sources/ for provenance and https://scholariq.org/methodology/ for what these figures mean.