# Optical constants of silicon and silicon dioxide using soft X-ray reflectance measurements

**Type:** Papers  
**Canonical URL:** https://scholariq.org/papers/optical-constants-of-silicon-and-silicon-dioxide-using-soft-x-ray-reflectance/

## Facts

| Field | Value |
| --- | --- |
| Author Names | Pragya Tripathi,G. S. Lodha,Mohammed H. Modi,A. K. Sinha,Kawal Sawhney,R.V. Nandedkar |
| Citations | 27 |
| DOI | 10.1016/s0030-4018(02)01950-8 |
| Fields | Engineering,Physics and Astronomy |
| Open Access | false |
| OA Status | closed |
| OpenAlex ID | https://openalex.org/W2112096979 |
| Type | article |
| Year | 2002 |

## Paper authors

- [Pragya Tripathi](https://scholariq.org/researchers/pragya-tripathi/)

## Paper primary topic

- [Advanced X-ray Imaging Techniques](https://scholariq.org/topics/advanced-x-ray-imaging-techniques/)

## Paper topics

- [Advanced X-ray Imaging Techniques](https://scholariq.org/topics/advanced-x-ray-imaging-techniques/)
- [X-ray Spectroscopy and Fluorescence Analysis](https://scholariq.org/topics/x-ray-spectroscopy-and-fluorescence-analysis/)
- [Surface Roughness and Optical Measurements](https://scholariq.org/topics/surface-roughness-and-optical-measurements/)

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Source: ScholarIQ — public research metadata, principally OpenAlex. See https://scholariq.org/sources/ for provenance and https://scholariq.org/methodology/ for what these figures mean.