# Recent advances in surface defect inspection of industrial products using deep learning techniques

**Type:** Papers  
**Canonical URL:** https://scholariq.org/papers/recent-advances-in-surface-defect-inspection-of-industrial-products-using-deep/

## Facts

| Field | Value |
| --- | --- |
| Author Names | Xiaoqing Zheng,Song Zheng,Yaguang Kong,Jie Chen |
| Citations | 275 |
| DOI | 10.1007/s00170-021-06592-8 |
| Fields | Engineering |
| Open Access | false |
| OA Status | closed |
| OpenAlex ID | https://openalex.org/W3124804470 |
| Type | article |
| Year | 2021 |

## Paper authors

- [Jie Chen](https://scholariq.org/researchers/jie-chen/)

## Paper journal

- [The International Journal of Advanced Manufacturing Technology](https://scholariq.org/journals/the-international-journal-of-advanced-manufacturing-technology/)

## Paper primary topic

- [Industrial Vision Systems and Defect Detection](https://scholariq.org/topics/industrial-vision-systems-and-defect-detection/)

## Paper topics

- [Industrial Vision Systems and Defect Detection](https://scholariq.org/topics/industrial-vision-systems-and-defect-detection/)
- [Surface Roughness and Optical Measurements](https://scholariq.org/topics/surface-roughness-and-optical-measurements/)
- [Integrated Circuits and Semiconductor Failure Analysis](https://scholariq.org/topics/integrated-circuits-and-semiconductor-failure-analysis/)

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Source: ScholarIQ — public research metadata, principally OpenAlex. See https://scholariq.org/sources/ for provenance and https://scholariq.org/methodology/ for what these figures mean.