# Removing Anomalies as Noises for Industrial Defect Localization

**Type:** Papers  
**Canonical URL:** https://scholariq.org/papers/removing-anomalies-as-noises-for-industrial-defect-localization/

## Facts

| Field | Value |
| --- | --- |
| Author Names | Fanbin Lu,Xufeng Yao,Chi‐Wing Fu,Jiaya Jia |
| Citations | 55 |
| DOI | 10.1109/iccv51070.2023.01481 |
| Fields | Computer Science,Engineering |
| Open Access | false |
| OA Status | closed |
| OpenAlex ID | https://openalex.org/W4390872580 |
| Type | conference-paper |
| Year | 2023 |

## Paper authors

- [Xufeng Yao](https://scholariq.org/researchers/xufeng-yao/)

## Paper primary topic

- [Anomaly Detection Techniques and Applications](https://scholariq.org/topics/anomaly-detection-techniques-and-applications/)

## Paper topics

- [Anomaly Detection Techniques and Applications](https://scholariq.org/topics/anomaly-detection-techniques-and-applications/)
- [Industrial Vision Systems and Defect Detection](https://scholariq.org/topics/industrial-vision-systems-and-defect-detection/)
- [Digital Media Forensic Detection](https://scholariq.org/topics/digital-media-forensic-detection/)

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Source: ScholarIQ — public research metadata, principally OpenAlex. See https://scholariq.org/sources/ for provenance and https://scholariq.org/methodology/ for what these figures mean.