# Similarity measures for automatic defect detection on patterned textures

**Type:** Papers  
**Canonical URL:** https://scholariq.org/papers/similarity-measures-for-automatic-defect-detection-on-patterned-textures/

## Facts

| Field | Value |
| --- | --- |
| Author Names | V Asha,Nagappa U. Bhajantri,P. Nagabhushan |
| Citations | 17 |
| DOI | 10.1504/ijict.2012.048758 |
| Fields | Computer Science,Engineering |
| Open Access | false |
| OA Status | closed |
| OpenAlex ID | https://openalex.org/W2131313623 |
| Type | article |
| Year | 2012 |

## Paper authors

- [V Asha](https://scholariq.org/researchers/v-asha/)

## Paper journal

- [International Journal of Information and Communication Technology](https://scholariq.org/journals/international-journal-of-information-and-communication-technology/)

## Paper primary topic

- [Industrial Vision Systems and Defect Detection](https://scholariq.org/topics/industrial-vision-systems-and-defect-detection/)

## Paper topics

- [Industrial Vision Systems and Defect Detection](https://scholariq.org/topics/industrial-vision-systems-and-defect-detection/)
- [Image Processing Techniques and Applications](https://scholariq.org/topics/image-processing-techniques-and-applications/)
- [Image and Object Detection Techniques](https://scholariq.org/topics/image-and-object-detection-techniques/)

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Source: ScholarIQ — public research metadata, principally OpenAlex. See https://scholariq.org/sources/ for provenance and https://scholariq.org/methodology/ for what these figures mean.