# Simulation-based optimization of sampling plans to reduce inspections while mastering the risk exposure in semiconductor manufacturing

**Type:** Papers  
**Canonical URL:** https://scholariq.org/papers/simulation-based-optimization-of-sampling-plans-to-reduce-inspections-while/

## Facts

| Field | Value |
| --- | --- |
| Author Names | M’hammed Sahnoun,Belgacem Bettayeb,Samuel-Jean Bassetto,Michel Tollenaere |
| Citations | 27 |
| DOI | 10.1007/s10845-014-0956-x |
| Fields | Computer Science,Engineering |
| Open Access | false |
| OA Status | closed |
| OpenAlex ID | https://openalex.org/W2085837170 |
| Type | article |
| Year | 2014 |

## Paper authors

- [Michel Tollenaere](https://scholariq.org/researchers/michel-tollenaere/)

## Paper journal

- [Journal of Intelligent Manufacturing](https://scholariq.org/journals/journal-of-intelligent-manufacturing/)

## Paper primary topic

- [Manufacturing Process and Optimization](https://scholariq.org/topics/manufacturing-process-and-optimization/)

## Paper topics

- [Manufacturing Process and Optimization](https://scholariq.org/topics/manufacturing-process-and-optimization/)
- [Industrial Vision Systems and Defect Detection](https://scholariq.org/topics/industrial-vision-systems-and-defect-detection/)
- [Advanced Multi-Objective Optimization Algorithms](https://scholariq.org/topics/advanced-multi-objective-optimization-algorithms/)

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Source: ScholarIQ — public research metadata, principally OpenAlex. See https://scholariq.org/sources/ for provenance and https://scholariq.org/methodology/ for what these figures mean.