# Straightness and flatness evaluation using data envelopment analysis

**Type:** Papers  
**Canonical URL:** https://scholariq.org/papers/straightness-and-flatness-evaluation-using-data-envelopment-analysis/

## Facts

| Field | Value |
| --- | --- |
| Author Names | Sohyung Cho,Joon-Young Kim |
| Citations | 23 |
| DOI | 10.1007/s00170-012-3925-6 |
| Fields | Decision Sciences,Engineering |
| Open Access | false |
| OA Status | closed |
| OpenAlex ID | https://openalex.org/W1983312847 |
| Type | article |
| Year | 2012 |

## Paper authors

- [Sohyung Cho](https://scholariq.org/researchers/sohyung-cho/)

## Paper journal

- [The International Journal of Advanced Manufacturing Technology](https://scholariq.org/journals/the-international-journal-of-advanced-manufacturing-technology/)

## Paper primary topic

- [Efficiency Analysis Using DEA](https://scholariq.org/topics/efficiency-analysis-using-dea/)

## Paper topics

- [Efficiency Analysis Using DEA](https://scholariq.org/topics/efficiency-analysis-using-dea/)
- [Industrial Vision Systems and Defect Detection](https://scholariq.org/topics/industrial-vision-systems-and-defect-detection/)
- [Advanced Measurement and Metrology Techniques](https://scholariq.org/topics/advanced-measurement-and-metrology-techniques/)

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Source: ScholarIQ — public research metadata, principally OpenAlex. See https://scholariq.org/sources/ for provenance and https://scholariq.org/methodology/ for what these figures mean.