# Wafer defect identification with optimal hyper-parameter tuning of support vector machine using the deep feature of ResNet 101

**Type:** Papers  
**Canonical URL:** https://scholariq.org/papers/wafer-defect-identification-with-optimal-hyper-parameter-tuning-of-support-2/

## Facts

| Field | Value |
| --- | --- |
| Author Names | Santi Kumari Behera,Shishir Dash,Rajat Amat,Prabira Kumar Sethy |
| Citations | 13 |
| DOI | 10.1007/s13198-023-02220-8 |
| Fields | Engineering |
| Open Access | false |
| OA Status | closed |
| OpenAlex ID | https://openalex.org/W4390228453 |
| Type | article |
| Year | 2023 |

## Paper authors

- [Rajat Amat](https://scholariq.org/researchers/rajat-amat/)

## Paper journal

- [International Journal of Systems Assurance Engineering and Management](https://scholariq.org/journals/international-journal-of-systems-assurance-engineering-and-management/)

## Paper primary topic

- [Industrial Vision Systems and Defect Detection](https://scholariq.org/topics/industrial-vision-systems-and-defect-detection/)

## Paper topics

- [Industrial Vision Systems and Defect Detection](https://scholariq.org/topics/industrial-vision-systems-and-defect-detection/)
- [Advanced Machining and Optimization Techniques](https://scholariq.org/topics/advanced-machining-and-optimization-techniques/)
- [Integrated Circuits and Semiconductor Failure Analysis](https://scholariq.org/topics/integrated-circuits-and-semiconductor-failure-analysis/)

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Source: ScholarIQ — public research metadata, principally OpenAlex. See https://scholariq.org/sources/ for provenance and https://scholariq.org/methodology/ for what these figures mean.