# Wafer Defect Identification with Optimal Hyper-Parameter Tuning of Support Vector Machine using the Deep Feature of ResNet 101

**Type:** Papers  
**Canonical URL:** https://scholariq.org/papers/wafer-defect-identification-with-optimal-hyper-parameter-tuning-of-support/

## Facts

| Field | Value |
| --- | --- |
| Author Names | Shishir Dash,J. Ramadevi,Rajat Amat,Prabira Kumar Sethy,Santi Kumari Behera,Sunil Mallick |
| Citations | 6 |
| DOI | 10.1088/1757-899x/1291/1/012048 |
| Fields | Engineering |
| Open Access | true |
| OA Status | diamond |
| OA URL | https://iopscience.iop.org/article/10.1088/1757-899X/1291/1/012048/pdf |
| OpenAlex ID | https://openalex.org/W4387346783 |
| Type | conference-paper |
| Year | 2023 |

## Paper authors

- [Rajat Amat](https://scholariq.org/researchers/rajat-amat/)

## Paper primary topic

- [Industrial Vision Systems and Defect Detection](https://scholariq.org/topics/industrial-vision-systems-and-defect-detection/)

## Paper topics

- [Industrial Vision Systems and Defect Detection](https://scholariq.org/topics/industrial-vision-systems-and-defect-detection/)
- [Integrated Circuits and Semiconductor Failure Analysis](https://scholariq.org/topics/integrated-circuits-and-semiconductor-failure-analysis/)
- [Advancements in Photolithography Techniques](https://scholariq.org/topics/advancements-in-photolithography-techniques/)

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Source: ScholarIQ — public research metadata, principally OpenAlex. See https://scholariq.org/sources/ for provenance and https://scholariq.org/methodology/ for what these figures mean.