# X-ray diffraction measurement of residual stress in sol-gel grown lead zirconate titanate thick films on nickel-based super alloy substrate

**Type:** Papers  
**Canonical URL:** https://scholariq.org/papers/x-ray-diffraction-measurement-of-residual-stress-in-sol-gel-grown-lead-zirconate/

## Facts

| Field | Value |
| --- | --- |
| Author Names | Hamidreza Hoshyarmanesh,Naser Nehzat,Mehdi Salehi,Mojtaba Ghodsi |
| Citations | 14 |
| DOI | 10.1007/s12206-015-0131-0 |
| Fields | Engineering,Materials Science |
| Open Access | false |
| OA Status | closed |
| OpenAlex ID | https://openalex.org/W2050119539 |
| Type | article |
| Year | 2015 |

## Paper authors

- [Hamidreza Hoshyarmanesh](https://scholariq.org/researchers/hamidreza-hoshyarmanesh/)

## Paper primary topic

- [Ferroelectric and Piezoelectric Materials](https://scholariq.org/topics/ferroelectric-and-piezoelectric-materials/)

## Paper topics

- [Ferroelectric and Piezoelectric Materials](https://scholariq.org/topics/ferroelectric-and-piezoelectric-materials/)
- [Acoustic Wave Resonator Technologies](https://scholariq.org/topics/acoustic-wave-resonator-technologies/)
- [Ultrasonics and Acoustic Wave Propagation](https://scholariq.org/topics/ultrasonics-and-acoustic-wave-propagation/)

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Source: ScholarIQ — public research metadata, principally OpenAlex. See https://scholariq.org/sources/ for provenance and https://scholariq.org/methodology/ for what these figures mean.