# C. J. Powell

**Type:** Researchers  
**Canonical URL:** https://scholariq.org/researchers/c-j-powell/

## Facts

| Field | Value |
| --- | --- |
| Citations | 21,037 |
| Field | Electron and X-Ray Spectroscopy Techniques |
| h-index | 62 |
| i10-index | 179 |
| Last Known Institution | National Institute of Standards and Technology |
| OpenAlex ID | https://openalex.org/A5057766761 |
| ORCID iD | https://orcid.org/0000-0001-8990-2286 |
| Works | 279 |

## Researcher topics

- [Surface and Thin Film Phenomena](https://scholariq.org/topics/surface-and-thin-film-phenomena/)
- [Electron and X-Ray Spectroscopy Techniques](https://scholariq.org/topics/electron-and-x-ray-spectroscopy-techniques/)
- [X-ray Spectroscopy and Fluorescence Analysis](https://scholariq.org/topics/x-ray-spectroscopy-and-fluorescence-analysis-2/)
- [Advancements in Photolithography Techniques](https://scholariq.org/topics/advancements-in-photolithography-techniques/)
- [Semiconductor materials and devices](https://scholariq.org/topics/semiconductor-materials-and-devices/)

## Researcher university

- [National Institute of Standards and Technology](https://scholariq.org/institutions/national-institute-of-standards-and-technology/)

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Source: ScholarIQ — public research metadata, principally OpenAlex. See https://scholariq.org/sources/ for provenance and https://scholariq.org/methodology/ for what these figures mean.