# Chang Ouk Kim

**Type:** Researchers  
**Canonical URL:** https://scholariq.org/researchers/chang-ouk-kim/

## Facts

| Field | Value |
| --- | --- |
| Citations | 2,434 |
| Field | Industrial Vision Systems and Defect Detection |
| h-index | 25 |
| i10-index | 46 |
| Last Known Institution | Yonsei University |
| OpenAlex ID | https://openalex.org/A5001540138 |
| ORCID iD | 0000-0002-6936-5409 |
| Works | 100 |

## Researcher papers

- [A Convolutional Neural Network for Fault Classification and Diagnosis in Semiconductor Manufacturing Processes](https://scholariq.org/papers/a-convolutional-neural-network-for-fault-classification-and-diagnosis-in/)
- [Convolutional Neural Network for Wafer Surface Defect Classification and the Detection of Unknown Defect Class](https://scholariq.org/papers/convolutional-neural-network-for-wafer-surface-defect-classification-and-the/)
- [Quality-of-service oriented web service composition algorithm and planning architecture](https://scholariq.org/papers/quality-of-service-oriented-web-service-composition-algorithm-and-planning/)
- [A Deep Learning Model for Robust Wafer Fault Monitoring With Sensor Measurement Noise](https://scholariq.org/papers/a-deep-learning-model-for-robust-wafer-fault-monitoring-with-sensor-measurement/)
- [Agent-based diffusion model for an automobile market with fuzzy TOPSIS-based product adoption process](https://scholariq.org/papers/agent-based-diffusion-model-for-an-automobile-market-with-fuzzy-topsis-based/)
- [Recurrent feature-incorporated convolutional neural network for virtual metrology of the chemical mechanical planarization process](https://scholariq.org/papers/recurrent-feature-incorporated-convolutional-neural-network-for-virtual/)
- [Forward–backward analysis of RFID-enabled supply chain using fuzzy cognitive map and genetic algorithm](https://scholariq.org/papers/forward-backward-analysis-of-rfid-enabled-supply-chain-using-fuzzy-cognitive-map/)
- [Performance of Machine Learning Algorithms for Class-Imbalanced Process Fault Detection Problems](https://scholariq.org/papers/performance-of-machine-learning-algorithms-for-class-imbalanced-process-fault/)
- [Adaptive product tracking in RFID-enabled large-scale supply chain](https://scholariq.org/papers/adaptive-product-tracking-in-rfid-enabled-large-scale-supply-chain/)
- [An Incremental Clustering-Based Fault Detection Algorithm for Class-Imbalanced Process Data](https://scholariq.org/papers/an-incremental-clustering-based-fault-detection-algorithm-for-class-imbalanced/)
- [A data mining approach to the causal analysis of product faults in multi-stage PCB manufacturing](https://scholariq.org/papers/a-data-mining-approach-to-the-causal-analysis-of-product-faults-in-multi-stage/)

## Researcher topics

- [Industrial Vision Systems and Defect Detection](https://scholariq.org/topics/industrial-vision-systems-and-defect-detection/)
- [Scheduling and Optimization Algorithms](https://scholariq.org/topics/scheduling-and-optimization-algorithms/)
- [Supply Chain and Inventory Management](https://scholariq.org/topics/supply-chain-and-inventory-management/)
- [Fault Detection and Control Systems](https://scholariq.org/topics/fault-detection-and-control-systems/)
- [Advancements in Photolithography Techniques](https://scholariq.org/topics/advancements-in-photolithography-techniques/)

## Researcher university

- [Yonsei University](https://scholariq.org/institutions/yonsei-university/)

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Source: ScholarIQ — public research metadata, principally OpenAlex. See https://scholariq.org/sources/ for provenance and https://scholariq.org/methodology/ for what these figures mean.