# David C. Joy

**Type:** Researchers  
**Canonical URL:** https://scholariq.org/researchers/david-c-joy/

## Facts

| Field | Value |
| --- | --- |
| Citations | 24,590 |
| Field | Electron and X-Ray Spectroscopy Techniques |
| h-index | 53 |
| i10-index | 186 |
| Last Known Institution | Kitware (United States) |
| OpenAlex ID | https://openalex.org/A5111674428 |
| ORCID iD | https://orcid.org/0000-0003-3892-5167 |
| Works | 627 |

## Researcher topics

- [Advanced Materials Characterization Techniques](https://scholariq.org/topics/advanced-materials-characterization-techniques/)
- [Electron and X-Ray Spectroscopy Techniques](https://scholariq.org/topics/electron-and-x-ray-spectroscopy-techniques/)
- [Advanced Electron Microscopy Techniques and Applications](https://scholariq.org/topics/advanced-electron-microscopy-techniques-and-applications/)
- [Advancements in Photolithography Techniques](https://scholariq.org/topics/advancements-in-photolithography-techniques/)
- [X-ray Spectroscopy and Fluorescence Analysis](https://scholariq.org/topics/x-ray-spectroscopy-and-fluorescence-analysis-2/)

## Researcher university

- [Kitware (United States)](https://scholariq.org/institutions/kitware-united-states/)

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Source: ScholarIQ — public research metadata, principally OpenAlex. See https://scholariq.org/sources/ for provenance and https://scholariq.org/methodology/ for what these figures mean.