# Industrial Vision Systems and Defect Detection

**Type:** Topics  
**Canonical URL:** https://scholariq.org/topics/industrial-vision-systems-and-defect-detection-2/

## Facts

| Field | Value |
| --- | --- |
| Citations | 743,770 |
| Description | This cluster of papers focuses on the application of machine vision, texture analysis, and deep learning techniques for the automated detection and classification of fabric defects in industrial settings, particularly in semiconductor manufacturing. The research covers various methods such as Gabor filters, wafer map defect classification, and virtual metrology to enhance the accuracy and efficiency of fabric defect detection systems. |
| Domain | Physical Sciences |
| Field | Engineering |
| OpenAlex ID | https://openalex.org/T12111 |
| Works | 102,592 |

## Topic researchers

Showing 12 of 20.

- [Kaiming He](https://scholariq.org/researchers/kaiming-he/)
- [Geoffrey E. Hinton](https://scholariq.org/researchers/geoffrey-e-hinton/)
- [Xiangyu Zhang](https://scholariq.org/researchers/xiangyu-zhang/)
- [Andrew Zisserman](https://scholariq.org/researchers/andrew-zisserman/)
- [Xiaogang Wang](https://scholariq.org/researchers/xiaogang-wang/)
- [Alex Krizhevsky](https://scholariq.org/researchers/alex-krizhevsky/)
- [Jian Sun](https://scholariq.org/researchers/jian-sun-3/)
- [David Lowe](https://scholariq.org/researchers/david-lowe/)
- [Eric R. Ziegel](https://scholariq.org/researchers/eric-r-ziegel/)
- [Xiaoou Tang](https://scholariq.org/researchers/xiaoou-tang/)
- [Dacheng Tao](https://scholariq.org/researchers/dacheng-tao/)
- [Shuicheng Yan](https://scholariq.org/researchers/shuicheng-yan/)

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Source: ScholarIQ — public research metadata, principally OpenAlex. See https://scholariq.org/sources/ for provenance and https://scholariq.org/methodology/ for what these figures mean.