# Integrated Circuits and Semiconductor Failure Analysis

**Type:** Topics  
**Canonical URL:** https://scholariq.org/topics/integrated-circuits-and-semiconductor-failure-analysis-2/

## Facts

| Field | Value |
| --- | --- |
| Citations | 266,275 |
| Description | This cluster of papers focuses on advanced techniques and methodologies for failure analysis of integrated circuits. It covers a wide range of topics including photon emission microscopy, laser voltage probing, backside analysis, nanoprobing, fault localization, time-resolved imaging, and electrical characterization. The papers explore innovative approaches to identify and analyze failures in CMOS circuits and other semiconductor devices. |
| Domain | Physical Sciences |
| Field | Engineering |
| OpenAlex ID | https://openalex.org/T14117 |
| Works | 45,892 |

## Topic researchers

Showing 12 of 20.

- [Steven A. Rosenberg](https://scholariq.org/researchers/steven-a-rosenberg/)
- [Jürgen Schmidhuber](https://scholariq.org/researchers/jurgen-schmidhuber/)
- [Michael I. Jordan](https://scholariq.org/researchers/michael-i-jordan/)
- [Solomon H. Snyder](https://scholariq.org/researchers/solomon-h-snyder/)
- [Anil K. Sood](https://scholariq.org/researchers/anil-k-sood/)
- [Carl H. June](https://scholariq.org/researchers/carl-h-june/)
- [Charles M. Lieber](https://scholariq.org/researchers/charles-m-lieber/)
- [Johann S. de Bono](https://scholariq.org/researchers/johann-s-de-bono/)
- [Steven G. Louie](https://scholariq.org/researchers/steven-g-louie/)
- [C. Lacasta](https://scholariq.org/researchers/c-lacasta/)
- [Daniel S. Berman](https://scholariq.org/researchers/daniel-s-berman/)
- [Martine Piccart](https://scholariq.org/researchers/martine-piccart/)

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Source: ScholarIQ — public research metadata, principally OpenAlex. See https://scholariq.org/sources/ for provenance and https://scholariq.org/methodology/ for what these figures mean.