# Radiation Effects in Electronics

**Type:** Topics  
**Canonical URL:** https://scholariq.org/topics/radiation-effects-in-electronics-2/

## Facts

| Field | Value |
| --- | --- |
| Citations | 393,599 |
| Description | This cluster of papers focuses on the challenges and techniques for fault tolerance in electronic systems, particularly in the context of soft errors, radiation effects, and single event upsets in CMOS technology. It explores various methods for error detection, reliability evaluation, and mitigation of transient faults in nanoelectronics. |
| Domain | Physical Sciences |
| Field | Engineering |
| OpenAlex ID | https://openalex.org/T11005 |
| Works | 48,973 |

## Topic researchers

Showing 12 of 20.

- [M. Weber](https://scholariq.org/researchers/m-weber/)
- [Rodney S. Ruoff](https://scholariq.org/researchers/rodney-s-ruoff/)
- [Frede Blaabjerg](https://scholariq.org/researchers/frede-blaabjerg/)
- [Hongjie Dai](https://scholariq.org/researchers/hongjie-dai-2/)
- [H. P. Beck](https://scholariq.org/researchers/h-p-beck/)
- [H. F-W. Sadrozinski](https://scholariq.org/researchers/h-f-w-sadrozinski/)
- [B. Stugu](https://scholariq.org/researchers/b-stugu/)
- [James Hone](https://scholariq.org/researchers/james-hone/)
- [M. D’Onofrio](https://scholariq.org/researchers/m-d-onofrio/)
- [G. Watts](https://scholariq.org/researchers/g-watts/)
- [G. Gómez](https://scholariq.org/researchers/g-gomez/)
- [E. Shabalina](https://scholariq.org/researchers/e-shabalina/)

---
Source: ScholarIQ — public research metadata, principally OpenAlex. See https://scholariq.org/sources/ for provenance and https://scholariq.org/methodology/ for what these figures mean.