# Surface Roughness and Optical Measurements

**Type:** Topics  
**Canonical URL:** https://scholariq.org/topics/surface-roughness-and-optical-measurements-2/

## Facts

| Field | Value |
| --- | --- |
| Citations | 334,150 |
| Description | This cluster of papers focuses on the characterization and measurement of surface roughness in optical components, utilizing techniques such as fractal analysis, machine vision, scattering theory, and thin film analysis. The research covers topics such as surface roughness measurement, power spectral density analysis, micromorphology characterization, and the application of image processing for evaluating surface roughness. |
| Domain | Physical Sciences |
| Field | Engineering |
| OpenAlex ID | https://openalex.org/T13049 |
| Works | 54,708 |

## Topic researchers

Showing 12 of 20.

- [John P. Perdew](https://scholariq.org/researchers/john-p-perdew/)
- [George M. Whitesides](https://scholariq.org/researchers/george-m-whitesides/)
- [Akira Fujishima](https://scholariq.org/researchers/akira-fujishima/)
- [F. Vetrano](https://scholariq.org/researchers/f-vetrano/)
- [Takeo Kanade](https://scholariq.org/researchers/takeo-kanade/)
- [Bharat Bhushan](https://scholariq.org/researchers/bharat-bhushan/)
- [F. Travasso](https://scholariq.org/researchers/f-travasso/)
- [Thomas P. Russell](https://scholariq.org/researchers/thomas-p-russell/)
- [Leonidas Guibas](https://scholariq.org/researchers/leonidas-guibas/)
- [M. Hrabovský](https://scholariq.org/researchers/m-hrabovsky/)
- [A. R. Wade](https://scholariq.org/researchers/a-r-wade/)
- [M. Cardona](https://scholariq.org/researchers/m-cardona/)

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Source: ScholarIQ — public research metadata, principally OpenAlex. See https://scholariq.org/sources/ for provenance and https://scholariq.org/methodology/ for what these figures mean.