ScholarIQanswers from OpenAlex
Quality and Reliability Engineering International
JournalCitation impact & published research
Quality and Reliability Engineering International is a journal indexed in ScholarIQ from OpenAlex.
How many works does Quality and Reliability Engineering International have?
ScholarIQindexed works
Quality and Reliability Engineering International has 5,505 works in the ScholarIQ index. The count is the OpenAlex total, not the number of papers listed on this page.
How many citations does Quality and Reliability Engineering International have?
ScholarIQcitation count
Quality and Reliability Engineering International has 68,528 citations in the OpenAlex counts ScholarIQ stores.
What is the h-index of Quality and Reliability Engineering International?
ScholarIQh-index
Quality and Reliability Engineering International has an h-index of 89 in OpenAlex.
What is the article processing charge of Quality and Reliability Engineering International?
ScholarIQarticle processing charge
Quality and Reliability Engineering International lists an article processing charge of 4,330 USD in OpenAlex.
What is the OpenAlex record for Quality and Reliability Engineering International?
ScholarIQopenalex
The OpenAlex for Quality and Reliability Engineering International is on the source record.
What are the most-cited papers on Quality and Reliability Engineering International?
ScholarIQmost cited works
How Can SMEs Benefit from Big Data? Challenges and a Path Forward
Shirley Coleman, Rainer Göb, Giuseppe Manco, Antonio Pievatolo, Xavier Tort‐Martorell, Marco S. Reis
Non-normal Capability Indices for the Weibull and Lognormal Distributions
Manuel R. Piña‐Monarrez, Jesús F. Ortiz-Yáñez, Manuel Iván Rodríguez Borbón
Weibull stress distribution for static mechanical stress and its stress/strength analysis
Manuel R. Piña‐Monarrez
Research on reliability allocation technology for NC machine tool meta‐action
Yulong Li, Genbao Zhang, Yongqin Wang, Xiaogang Zhang, Yan Ran
Research on meta‐action decomposition and meta‐action unit modeling technology for electromechanical product
Yulong Li, Xiaogang Zhang, Yan Ran, Genbao Zhang, Yongqin Wang