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Characterization of Dielectric Substrates Using Dual Band Microwave Sensor
PaperCitations, authors & open-access status
Characterization of Dielectric Substrates Using Dual Band Microwave Sensor is a paper indexed in ScholarIQ from OpenAlex. ScholarIQ records 69 citations, 2021 year and gold oa status.
69
Citations
2021
Year
gold
OA Status