Scholar IQ
Try ScholarIQ free
Upload Records Snowball Search Search OpenAlex
About the database
ScholarIQanswers from OpenAlex

Development of a Numerical Procedure for Determining the Depth Profiles of X-Ray Diffraction Data

PaperCitations, authors & open-access status

Development of a Numerical Procedure for Determining the Depth Profiles of X-Ray Diffraction Data is a paper indexed in ScholarIQ from OpenAlex. ScholarIQ records 11 citations, 1993 year and closed oa status.

11
Citations
1993
Year
closed
OA Status

Related on ScholarIQ

Xiaojing Zhu
Author
Advances in X-ray Analysis
Journal
X-ray Diffraction in Crystallography
Topic
X-ray Diffraction in Crystallography
Topic
Microstructure and Mechanical Properties of Steels
Topic
Microstructure and mechanical properties
Topic
470M+ articles · free account