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Ensemble Bayesian Network for root cause analysis of product defects via learning from historical production data

PaperCitations, authors & open-access status

Ensemble Bayesian Network for root cause analysis of product defects via learning from historical production data is a paper indexed in ScholarIQ from OpenAlex. ScholarIQ records 22 citations, 2024 year and hybrid oa status.

22
Citations
2024
Year
hybrid
OA Status

Related on ScholarIQ

Karen Wang
Author
Chao Liu
Author
Yuqian Lu
Author
Journal of Manufacturing Systems
Journal
Fault Detection and Control Systems
Topic
Fault Detection and Control Systems
Topic
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