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Fault Cause Identification across Manufacturing Lines through Ontology-Guided and Process-Aware FMEA Graph Learning with LLMs

PaperCitations, authors & open-access status

Fault Cause Identification across Manufacturing Lines through Ontology-Guided and Process-Aware FMEA Graph Learning with LLMs is a paper indexed in ScholarIQ from OpenAlex. ScholarIQ records 0 citations, 2025 year and green oa status.

0
Citations
2025
Year
green
OA Status

Related on ScholarIQ

Sho Okazaki
Author
arXiv (Cornell University)
Journal
Machine Fault Diagnosis Techniques
Topic
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Topic
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