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High-exposure-durability, high-quantum-efficiency (>90%) backside-illuminated soft-X-ray CMOS sensor

PaperCitations, authors & open-access status

High-exposure-durability, high-quantum-efficiency (>90%) backside-illuminated soft-X-ray CMOS sensor is a paper indexed in ScholarIQ from OpenAlex. ScholarIQ records 41 citations, 2019 year and hybrid oa status.

41
Citations
2019
Year
hybrid
OA Status

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