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Multifrequency Excitation and Support Vector Machine Regressor for ECT Defect Characterization

PaperCitations, authors & open-access status

Multifrequency Excitation and Support Vector Machine Regressor for ECT Defect Characterization is a paper indexed in ScholarIQ from OpenAlex. ScholarIQ records 69 citations, 2014 year and green oa status.

69
Citations
2014
Year
green
OA Status

Related on ScholarIQ

Luigi Ferrigno
Author
IEEE Transactions on Instrumentation and Measurement
Journal
Non-Destructive Testing Techniques
Topic
Non-Destructive Testing Techniques
Topic
Ultrasonics and Acoustic Wave Propagation
Topic
Geophysical Methods and Applications
Topic
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