Scholar IQ
Try ScholarIQ free
Upload Records Snowball Search Search OpenAlex
About the database
ScholarIQanswers from OpenAlex

Multiple-surface interferometry of highly reflective wafer by wavelength tuning

PaperCitations, authors & open-access status

Multiple-surface interferometry of highly reflective wafer by wavelength tuning is a paper indexed in ScholarIQ from OpenAlex. ScholarIQ records 75 citations, 2014 year and gold oa status.

75
Citations
2014
Year
gold
OA Status

Related on ScholarIQ

Naohiko Sugita
Author
Optical measurement and interference techniques
Topic
Optical measurement and interference techniques
Topic
Surface Roughness and Optical Measurements
Topic
Advanced Measurement and Metrology Techniques
Topic
470M+ articles · free account