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Nanotechnology in Cement-Based Materials: A Review of Durability, Modeling, and Advanced Characterization

PaperCitations, authors & open-access status

Nanotechnology in Cement-Based Materials: A Review of Durability, Modeling, and Advanced Characterization is a paper indexed in ScholarIQ from OpenAlex.

How many citations does Nanotechnology in Cement-Based Materials: A Review of Durability, Modeling, and Advanced Characterization have?

ScholarIQcitation count

Nanotechnology in Cement-Based Materials: A Review of Durability, Modeling, and Advanced Characterization has 163 citations in the OpenAlex counts ScholarIQ stores.

When was Nanotechnology in Cement-Based Materials: A Review of Durability, Modeling, and Advanced Characterization published?

ScholarIQyear

Nanotechnology in Cement-Based Materials: A Review of Durability, Modeling, and Advanced Characterization has 2019 year in the ScholarIQ index.

What is the open-access status of Nanotechnology in Cement-Based Materials: A Review of Durability, Modeling, and Advanced Characterization?

ScholarIQoa status

Nanotechnology in Cement-Based Materials: A Review of Durability, Modeling, and Advanced Characterization has gold oa status in the ScholarIQ index.

What is the DOI of Nanotechnology in Cement-Based Materials: A Review of Durability, Modeling, and Advanced Characterization?

ScholarIQdoi

The DOI for Nanotechnology in Cement-Based Materials: A Review of Durability, Modeling, and Advanced Characterization is on the source record.

What is the PMID of Nanotechnology in Cement-Based Materials: A Review of Durability, Modeling, and Advanced Characterization?

ScholarIQpmid

The PMID for Nanotechnology in Cement-Based Materials: A Review of Durability, Modeling, and Advanced Characterization is on the source record.

What is the OpenAlex record for Nanotechnology in Cement-Based Materials: A Review of Durability, Modeling, and Advanced Characterization?

ScholarIQopenalex

The OpenAlex for Nanotechnology in Cement-Based Materials: A Review of Durability, Modeling, and Advanced Characterization is on the source record.

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