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Optical constants of silicon and silicon dioxide using soft X-ray reflectance measurements

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Optical constants of silicon and silicon dioxide using soft X-ray reflectance measurements is a paper indexed in ScholarIQ from OpenAlex.

How many citations does Optical constants of silicon and silicon dioxide using soft X-ray reflectance measurements have?

ScholarIQcitation count

Optical constants of silicon and silicon dioxide using soft X-ray reflectance measurements has 27 citations in the OpenAlex counts ScholarIQ stores.

When was Optical constants of silicon and silicon dioxide using soft X-ray reflectance measurements published?

ScholarIQyear

Optical constants of silicon and silicon dioxide using soft X-ray reflectance measurements has 2002 year in the ScholarIQ index.

What is the open-access status of Optical constants of silicon and silicon dioxide using soft X-ray reflectance measurements?

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Optical constants of silicon and silicon dioxide using soft X-ray reflectance measurements has closed oa status in the ScholarIQ index.

What is the DOI of Optical constants of silicon and silicon dioxide using soft X-ray reflectance measurements?

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The DOI for Optical constants of silicon and silicon dioxide using soft X-ray reflectance measurements is on the source record.

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The OpenAlex for Optical constants of silicon and silicon dioxide using soft X-ray reflectance measurements is on the source record.

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