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Optical constants of silicon and silicon dioxide using soft X-ray reflectance measurements

PaperCitations, authors & open-access status

Optical constants of silicon and silicon dioxide using soft X-ray reflectance measurements is a paper indexed in ScholarIQ from OpenAlex. ScholarIQ records 27 citations, 2002 year and closed oa status.

27
Citations
2002
Year
closed
OA Status

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