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Thickness dependence of structural and piezoelectric properties of epitaxial Pb(Zr0.52Ti0.48)O3 films on Si and SrTiO3 substrates
PaperCitations, authors & open-access status
Thickness dependence of structural and piezoelectric properties of epitaxial Pb(Zr0.52Ti0.48)O3 films on Si and SrTiO3 substrates is a paper indexed in ScholarIQ from OpenAlex. ScholarIQ records 139 citations, 2006 year and bronze oa status.
139
Citations
2006
Year
bronze
OA Status