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X-ray diffraction measurement of residual stress in sol-gel grown lead zirconate titanate thick films on nickel-based super alloy substrate
PaperCitations, authors & open-access status
X-ray diffraction measurement of residual stress in sol-gel grown lead zirconate titanate thick films on nickel-based super alloy substrate is a paper indexed in ScholarIQ from OpenAlex. ScholarIQ records 14 citations, 2015 year and closed oa status.
14
Citations
2015
Year
closed
OA Status