Agnès Roussy

ResearcherPublications, citations & collaboration network

Agnès Roussy is a researcher indexed in ScholarIQ from OpenAlex & ORCID. ScholarIQ records 52 works, 311 citations, an h-index of 9 and an i10-index of 9.

Works

311

Citations

h-index

i10-index

IDs:OpenAlex

How has Agnès Roussy's publication output changed over time?

ScholarIQpublication output · 2001–2022

Output declined50% over the shown period — from 2 works in 2001 to 1 in 2022.

20012009201120122019202020212022

What are the most-cited papers on Agnès Roussy?

ScholarIQmost cited works

An interpretable unsupervised Bayesian network model for fault detection and diagnosis

Wei-Ting Yang, Marco S. Reis, Valeria Borodin, Michel Juge, Agnès Roussy

Control Engineering Practice. 202250 CitationsOPEN ACCESS

NbN multilayer technology on R-plane sapphire

J.-C. Villegirr, N. Hadacek, S. Monso, B. Delnet, Agnès Roussy, Pascal Febvre, G. Lamura, J.-Y. Laval

S119074828. 200141 Citations

A Structure Data-Driven Framework for Virtual Metrology Modeling

Wei-Ting Yang, Jakey Blue, Agnès Roussy, Jacques Pinaton, Marco S. Reis

S34881539. 201930 Citations

Virtual Metrology Modeling for CVD Film Thickness

Jérôme Besnard, Dietmar Gleispach, Hervé Gris, Ariane Ferreira, Agnès Roussy, Christelle Kernaflen, Günter Hayderer

International Journal of Control Science and Engineering. 201228 CitationsOPEN ACCESS

Virtual Metrology models for predicting physical measurement in semiconductor manufacturing

A. Ferreira, Agnès Roussy, Lamine Condé

200923 Citations

Related on ScholarIQ

Mines Saint-Étienne

Institution

An interpretable unsupervised Bayesian network model for fault detection and diagnosis

Paper

NbN multilayer technology on R-plane sapphire

Paper

A Structure Data-Driven Framework for Virtual Metrology Modeling

Paper

Virtual Metrology Modeling for CVD Film Thickness

Paper

Virtual Metrology models for predicting physical measurement in semiconductor manufacturing

Paper