ScholarIQanswers from OpenAlex
VLSI and Analog Circuit Testing
TopicLeading institutions, researchers & key papers
VLSI and Analog Circuit Testing is a topic indexed in ScholarIQ from OpenAlex.
What is known about VLSI and Analog Circuit Testing?
ScholarIQrecord summary
This cluster of papers focuses on various aspects of testing Very Large Scale Integration (VLSI) circuits, including techniques such as test data compression, embedded cores testing, scan testing, analog circuit fault diagnosis, BIST schemes, test access architectures, low-power testing, and delay fault testing.
How many works does VLSI and Analog Circuit Testing have?
ScholarIQindexed works
VLSI and Analog Circuit Testing has 17 works in the ScholarIQ index. The count is the OpenAlex total, not the number of papers listed on this page.
What is the OpenAlex record for VLSI and Analog Circuit Testing?
ScholarIQopenalex
The OpenAlex for VLSI and Analog Circuit Testing is on the source record.
What are the most-cited papers on VLSI and Analog Circuit Testing?
ScholarIQmost cited works
Application of heuristic search and information theory to sequential fault diagnosis
Krishna R. Pattipati, M.G. Alexandridis
WCOMP: Waveform Comparison Tool for Mixed-signal Validation Regression in Memory Design
Peng Zhang, Wai-Shing Luk, Yu Song, Jiarong Tong, Pushan Tang, Xuan Zeng
Manufacturing Setup for 4 nm Semiconductor Integrated Circuits in India: Current Scenario and Opportunities
Manik Sadashiv Sonawane, Jayamala Kumar Patil, Vinay Sampatrao Mandlik, Sanjay S. Pawar
Where is VLSI and Analog Circuit Testing research published, and who funds it?
ScholarIQvenues & funding sources
TOP JOURNALS
TOP FUNDERS
National Science Foundation—
NIH—
Wellcome Trust—
European Research Council—
Funder breakdown is a member featureSign up free to unlock
How much of the research on VLSI and Analog Circuit Testing is open access?
ScholarIQopen access share
0%OPEN ACCESS