VLSI and Analog Circuit Testing

This cluster of papers focuses on various aspects of testing Very Large Scale Integration (VLSI) circuits, including techniques such as test data compression, embedded cores testing, scan testing, analog circuit fault diagnosis, BIST schemes, test access architectures, low-power testing, and delay fault testing.

How has VLSI and Analog Circuit Testing's publication output changed over time?

Output grew0% over the shown period — from 1 works in 1990 to 1 in 2025.

What are the most-cited papers on VLSI and Analog Circuit Testing?

Where is VLSI and Analog Circuit Testing research published, and who funds it?

How much of the research on VLSI and Analog Circuit Testing is open access?