ScholarIQanswers from OpenAlex
VLSI and Analog Circuit Testing
TopicLeading institutions, researchers & key papers
VLSI and Analog Circuit Testing is a topic indexed in ScholarIQ from OpenAlex.
What is known about VLSI and Analog Circuit Testing?
ScholarIQrecord summary
This cluster of papers focuses on various aspects of testing Very Large Scale Integration (VLSI) circuits, including techniques such as test data compression, embedded cores testing, scan testing, analog circuit fault diagnosis, BIST schemes, test access architectures, low-power testing, and delay fault testing.
How many works does VLSI and Analog Circuit Testing have?
ScholarIQindexed works
VLSI and Analog Circuit Testing has 58,084 works in the ScholarIQ index. The count is the OpenAlex total, not the number of papers listed on this page.
How many citations does VLSI and Analog Circuit Testing have?
ScholarIQcitation count
VLSI and Analog Circuit Testing has 457,909 citations in the OpenAlex counts ScholarIQ stores.
What is the OpenAlex record for VLSI and Analog Circuit Testing?
ScholarIQopenalex
The OpenAlex for VLSI and Analog Circuit Testing is on the source record.
Who are the most-cited researchers behind VLSI and Analog Circuit Testing?
ScholarIQtop researchers by citations
Where is VLSI and Analog Circuit Testing research published, and who funds it?
ScholarIQvenues & funding sources
TOP JOURNALS
No journal data available yet.
TOP FUNDERS
National Science Foundation—
NIH—
Wellcome Trust—
European Research Council—
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