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IEEE Electron Device Letters

JournalCitation impact & published research

IEEE Electron Device Letters is a journal indexed in ScholarIQ from OpenAlex.

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p-GaN Gate HEMTs With Tungsten Gate Metal for High Threshold Voltage and Low Gate Current
Injun Hwang, Jongseob Kim, Hyuk Choi, Hyoji Choi, Jaewon Lee, Kyung Yeon Kim, Jong-Bong Park, Jae Cheol Lee, Jong‐Bong Ha, Jaejoon Oh, Jaikwang Shin, U‐In Chung
IEEE Electron Device Letters. 2013286 Citations
The hetero-epitaxial SiCN/Si MSM photodetector for high-temperature deep-UV detecting applications
Wen-Rong Chang, Yean-Kuen Fang, S.F. Ting, Yong-Shiuan Tsair, Cheng-Nan Chang, Chun‐Yu Lin, Shih‐Fang Chen
IEEE Electron Device Letters. 200378 Citations
Zero-Mask Contact Fuse for One-Time-Programmable Memory in Standard CMOS Processes
Min Shi, Jin He, Lining Zhang, Chenyue Ma, Xingye Zhou, Haijun Lou, Hao Zhuang, Ruonan Wang, Yongliang Li, Yong Ma, Wen‐Wei Wu, Wenping Wang, Mansun Chan
IEEE Electron Device Letters. 201125 Citations
Novel Silicon-Controlled Rectifier With Snapback-Free Performance for High-Voltage and Robust ESD Protection
Zhao Qi, Ming Qiao, Longfei Liang, Fabei Zhang, Xin Zhou, Shikang Cheng, Sen Zhang, Feng Lin, Guipeng Sun, Zhaoji Li, Bo Zhang
IEEE Electron Device Letters. 201921 Citations
Comparative Analysis of <i>n</i>- and <i>p</i>-Type Ferroelectric Tunnel Junctions Through Understanding of Non-FE Resistance Switching
Ryun‐Han Koo, Wonjun Shin, Sangwoo Ryu, Kyungmin Lee, Sungho Park, Jiseong Im, Jonghyun Ko, Jeonghyun Kim, Dongseok Kwon, Jae‐Joon Kim, Daewoong Kwon, Jong‐Ho Lee
IEEE Electron Device Letters. 202317 Citations

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