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1D ResNet for Fault Detection and Classification on Sensor Data in Semiconductor Manufacturing

PaperCitations, authors & open-access status

1D ResNet for Fault Detection and Classification on Sensor Data in Semiconductor Manufacturing is a paper indexed in ScholarIQ from OpenAlex. ScholarIQ records 14 citations, 2022 year and closed oa status.

14
Citations
2022
Year
closed
OA Status

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