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Industrial Vision Systems and Defect Detection

TopicLeading institutions, researchers & key papers

Industrial Vision Systems and Defect Detection is a topic indexed in ScholarIQ from OpenAlex.

What is known about Industrial Vision Systems and Defect Detection?

ScholarIQrecord summary

This cluster of papers focuses on the application of machine vision, texture analysis, and deep learning techniques for the automated detection and classification of fabric defects in industrial settings, particularly in semiconductor manufacturing. The research covers various methods such as Gabor filters, wafer map defect classification, and virtual metrology to enhance the accuracy and efficiency of fabric defect detection systems.

How many works does Industrial Vision Systems and Defect Detection have?

ScholarIQindexed works

Industrial Vision Systems and Defect Detection has 202 works in the ScholarIQ index. The count is the OpenAlex total, not the number of papers listed on this page.

What is the OpenAlex record for Industrial Vision Systems and Defect Detection?

ScholarIQopenalex

The OpenAlex for Industrial Vision Systems and Defect Detection is on the source record.

What are the most-cited papers on Industrial Vision Systems and Defect Detection?

ScholarIQmost cited works
2012 IEEE Conference on Computer Vision and Pattern Recognition
Claudia Loy, Timothy M. Hospedales, Tianyu Xiang, Shiqiang Gong
20121,895 Citations
Deep learning for smart manufacturing: Methods and applications
Jinjiang Wang, Yulin Ma, Laibin Zhang, Robert X. Gao, Dazhong Wu
Journal of Manufacturing Systems. 20181,662 CitationsOPEN ACCESS
Machine learning in manufacturing: advantages, challenges, and applications
Thorsten Wuest, D. R. Weimer, Christopher Irgens, Klaus‐Dieter Thoben
Production & Manufacturing Research. 20161,271 CitationsOPEN ACCESS
Recent advances and trends in predictive manufacturing systems in big data environment
Jay Lee, Edzel Lapira, Behrad Bagheri, Hung-An Kao
Manufacturing Letters. 20131,065 Citations
A Convolutional Neural Network for Fault Classification and Diagnosis in Semiconductor Manufacturing Processes
Ki Bum Lee, Sejune Cheon, Chang Ouk Kim
IEEE Transactions on Semiconductor Manufacturing. 2017477 Citations

Where is Industrial Vision Systems and Defect Detection research published, and who funds it?

ScholarIQvenues & funding sources

TOP FUNDERS

National Science Foundation—
NIH—
Wellcome Trust—
European Research Council—
Funder breakdown is a member featureSign up free to unlock

How much of the research on Industrial Vision Systems and Defect Detection is open access?

ScholarIQopen access share
33%OPEN ACCESS
Gold
13%
Green
13%
Hybrid
7%
Bronze
0%
Closed
67%

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