Scholar IQ
Try ScholarIQ free
Upload Records Snowball Search Search OpenAlex
About the database
ScholarIQanswers from OpenAlex

A Bayesian network approach for fixture fault diagnosis in launch of the assembly process

PaperCitations, authors & open-access status

A Bayesian network approach for fixture fault diagnosis in launch of the assembly process is a paper indexed in ScholarIQ from OpenAlex. ScholarIQ records 50 citations, 2011 year and closed oa status.

50
Citations
2011
Year
closed
OA Status

Related on ScholarIQ

Sun Jin
Author
International Journal of Production Research
Journal
Manufacturing Process and Optimization
Topic
Manufacturing Process and Optimization
Topic
Industrial Vision Systems and Defect Detection
Topic
Quality and Management Systems
Topic
470M+ articles · free account