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A Convolutional Neural Network for Fault Classification and Diagnosis in Semiconductor Manufacturing Processes

PaperCitations, authors & open-access status

A Convolutional Neural Network for Fault Classification and Diagnosis in Semiconductor Manufacturing Processes is a paper indexed in ScholarIQ from OpenAlex.

How many citations does A Convolutional Neural Network for Fault Classification and Diagnosis in Semiconductor Manufacturing Processes have?

ScholarIQcitation count

A Convolutional Neural Network for Fault Classification and Diagnosis in Semiconductor Manufacturing Processes has 477 citations in the OpenAlex counts ScholarIQ stores.

When was A Convolutional Neural Network for Fault Classification and Diagnosis in Semiconductor Manufacturing Processes published?

ScholarIQyear

A Convolutional Neural Network for Fault Classification and Diagnosis in Semiconductor Manufacturing Processes has 2017 year in the ScholarIQ index.

What is the open-access status of A Convolutional Neural Network for Fault Classification and Diagnosis in Semiconductor Manufacturing Processes?

ScholarIQoa status

A Convolutional Neural Network for Fault Classification and Diagnosis in Semiconductor Manufacturing Processes has closed oa status in the ScholarIQ index.

What is the DOI of A Convolutional Neural Network for Fault Classification and Diagnosis in Semiconductor Manufacturing Processes?

ScholarIQdoi

The DOI for A Convolutional Neural Network for Fault Classification and Diagnosis in Semiconductor Manufacturing Processes is on the source record.

What is the OpenAlex record for A Convolutional Neural Network for Fault Classification and Diagnosis in Semiconductor Manufacturing Processes?

ScholarIQopenalex

The OpenAlex for A Convolutional Neural Network for Fault Classification and Diagnosis in Semiconductor Manufacturing Processes is on the source record.

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